Determining the Electronic Performance Limitations in Top-Down-Fabricated Si Nanowires with Mean Widths Down to 4 nm (2014)

First Author: Mirza M

Attributed to: Evolvable Process Design (EPD) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/nl5015298

PubMed Identifier: 25299791

Publication URI: http://europepmc.org/abstract/MED/25299791

Type: Journal Article/Review

Parent Publication: Nano Letters

Issue: 11

ISSN: 1530-6984