📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Determining the electronic performance limitations in top-down-fabricated Si nanowires with mean widths down to 4 nm. (2014)

First Author: Mirza MM

Attributed to: Evolvable Process Design (EPD) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/nl5015298

PubMed Identifier: 25299791

Publication URI: http://europepmc.org/abstract/MED/25299791

Type: Journal Article/Review

Volume: 14

Parent Publication: Nano letters

Issue: 11

ISSN: 1530-6984