Determining the electronic performance limitations in top-down-fabricated Si nanowires with mean widths down to 4 nm. (2014)
Attributed to:
Evolvable Process Design (EPD)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/nl5015298
PubMed Identifier: 25299791
Publication URI: http://europepmc.org/abstract/MED/25299791
Type: Journal Article/Review
Volume: 14
Parent Publication: Nano letters
Issue: 11
ISSN: 1530-6984