X-ray Absorption Spectroscopy Study of TiO 2- x Thin Films for Memory Applications (2015)

First Author: Carta D

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/jp511739h

Publication URI: http://dx.doi.org/10.1021/jp511739h

Type: Journal Article/Review

Parent Publication: The Journal of Physical Chemistry C

Issue: 8