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A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics (2010)

First Author: Mendis B

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3486482

Publication URI: http://dx.doi.org/10.1063/1.3486482

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 9