Time evolution of off-state degradation of AlGaN/GaN high electron mobility transistors (2014)

First Author: Bajo M

Attributed to: Silicon Compatible GaN Power Electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4881637

Publication URI: http://dx.doi.org/10.1063/1.4881637

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 22