Aberration-corrected scanning transmission electron microscopy for atomic-resolution studies of functional oxides (2014)
Attributed to:
Using aberration corrected STEM to study the atomic structure of incommensurate antiferroelectrics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1179/1743280413y.0000000026
Publication URI: http://dx.doi.org/10.1179/1743280413y.0000000026
Type: Journal Article/Review
Parent Publication: International Materials Reviews
Issue: 3