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Composition depth profiling of polystyrene/poly(vinyl ethyl ether) blend thin films by angle resolved XPS (2009)

First Author: Beamson G

Attributed to: The National Centre for Electron Spectroscopy and Surface Analysis funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.elspec.2009.02.017

Publication URI: http://dx.doi.org/10.1016/j.elspec.2009.02.017

Type: Journal Article/Review

Parent Publication: Journal of Electron Spectroscopy and Related Phenomena

Issue: 1-3