Accurate measurement of the piezoelectric coefficient of thin films by eliminating the substrate bending effect using spatial scanning laser vibrometry (2010)
Attributed to:
PLATFORM GRANT RENEWAL: Nanoscale Multifunctional Ferroic Materials and Devices
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0964-1726/19/6/065011
Publication URI: http://dx.doi.org/10.1088/0964-1726/19/6/065011
Type: Journal Article/Review
Parent Publication: Smart Materials and Structures
Issue: 6