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Optical imaging beyond the diffraction limit by SNEM: Effects of AFM tip modifications with thiol monolayers on imaging quality (2015)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2014.12.001

PubMed Identifier: 25544678

Publication URI: http://europepmc.org/abstract/MED/25544678

Type: Journal Article/Review

Parent Publication: Ultramicroscopy

ISSN: 0304-3991