Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL (2013)
Attributed to:
Dynamics of Spin-VCSELs
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/jqe.2013.2282759
Publication URI: http://dx.doi.org/10.1109/jqe.2013.2282759
Type: Journal Article/Review
Parent Publication: IEEE Journal of Quantum Electronics
Issue: 11