Medium-energy ion-scattering study of strained holmium silicide nanoislands grown on silicon (100) (2008)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.78.035423
Publication URI: http://dx.doi.org/10.1103/physrevb.78.035423
Type: Journal Article/Review
Parent Publication: Physical Review B
Issue: 3