Fabrication and Stability Characterisation of Thin Film Transitors Based on Indium Zinc Oxide Deposited at Low Temperature (2008)

First Author: Li F

Attributed to: IKC in Advanced Manufacturing Technologies for Photonics and Electronics - Exploiting Molecular and Macromolecular Materials [MMM] funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: http://www.idtechex.com/events/presentations/fabrication-and-stability-characterisation-of-thin-film-transistors-based-on-indium-zinc-oxide-deposited-at-low-temperature-001769.asp

Type: Conference/Paper/Proceeding/Abstract

Parent Publication: Printed Electronics Europe 09