Optimizing electronic standard cell libraries for variability tolerance through the nano-CMOS grid. (2010)
Attributed to:
Meeting the design challenges of the nano-CMOS electronics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1098/rsta.2010.0150
PubMed Identifier: 20643688
Publication URI: http://europepmc.org/abstract/MED/20643688
Type: Journal Article/Review
Volume: 368
Parent Publication: Philosophical transactions. Series A, Mathematical, physical, and engineering sciences
Issue: 1925
ISSN: 1364-503X