Statistical distribution of RTS amplitudes in 20nm SOI FinFETs (2012)
Attributed to:
ENIAC MOdeling and DEsign of Reliable, process variation-aware Nanoelectronic devices, circuits and systems (MODERN)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/snw.2012.6243347
Publication URI: http://dx.doi.org/10.1109/SNW.2012.6243347
Type: Conference/Paper/Proceeding/Abstract