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Benchmarking of Thermal Boundary Resistance of GaN-SiC Interfaces for AlGaN/GaN HEMTs: US, European and Japanese Suppliers (2010)

First Author: Martin Kuball (Author)

Attributed to: Novel Time-Resolved Thermal Imaging: AlGaN/GaN Heterostructure Field Effect Transistors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Type: Conference/Paper/Proceeding/Abstract