The effects of dielectric loss and tip resistance on resonator Q of the scanning evanescent microwave microscopy (SEMM) probe (2008)

First Author: Kimber D
Attributed to:  Evanescent Microwave Spectroscopy for nanoscale measurements - feasibility study funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0957-0233/19/11/115502

Publication URI: http://dx.doi.org/10.1088/0957-0233/19/11/115502

Type: Journal Article/Review

Parent Publication: Measurement Science and Technology

Issue: 11