Tensor tomography using X-ray speckles

Speckle-based X-ray imaging, demonstrated just a few years ago, uses patterned X-ray illuminations to give access to phase-contrast and small-angle scattering signals from various specimens. The method, robust and inexpensive, has a strong potential for lab-based applications. Within this project, the PhD student will implement X-ray speckle imaging on a dedicated setup, and will develop novel data acquisition and image reconstruction techniques to extract directional dark-field signal, which will then be used to generate tensor maps of the scattering features in samples of interest. Though it will apply to a wide range of samples, the prime application will be the characterisation of carbon fibre composites used in the aeronautic industry.