Quantitative Photoluminescence Imaging of Compound Semiconductors

The performance, reliability, and yield of compound semiconductor devices such as solar cells, lasers, sensors and quantum devices is critically dependent on the quality of the material. Quantitative and reliable measurements for quality control of semiconductor wafers at a production line can increase productivity and reduce waste. Key indicators of the quality of a semiconductor material are the band gap and charge carrier lifetime, which can both be probed using photoluminescence spectroscopy. This project will work towards the development of a system that will enable fast spatial and spectral characterisation of semiconductor materials for in-line metrology through spectrally resolved, and time-resolved photoluminescence mapping using a compressed sensing technique. The demonstration of this prototype will introduce a new generation of in-line contactless tools for quantitative material characterisation.