Bias temperature instability and condition monitoring in SiC power MOSFETs (2018)

First Author: Ortiz Gonzalez J
Attributed to:  Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2018.06.045

Publication URI: http://dx.doi.org/10.1016/j.microrel.2018.06.045

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability