Crosstalk in SiC Power MOSFETs for Evaluation of Threshold Voltage Shift Caused by Bias Temperature Instability (2019)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.23919/epe.2019.8915508
Publication URI: http://dx.doi.org/10.23919/epe.2019.8915508
Type: Conference/Paper/Proceeding/Abstract