Impact of BTI-Induced Threshold Voltage Shifts in Shoot-Through Currents From Crosstalk in SiC MOSFETs (2021)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2020.3012298
Publication URI: http://dx.doi.org/10.1109/tpel.2020.3012298
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Power Electronics
Issue: 3