An Investigation of Gate Voltage Oscillation and its Suppression for SiC MOSFET (2020)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/access.2020.3008940
Publication URI: http://dx.doi.org/10.1109/access.2020.3008940
Type: Journal Article/Review
Parent Publication: IEEE Access