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Measurement and simulation of short circuit current sharing under parallel connection: SiC MOSFETs and SiC Cascode JFETs (2021)

First Author: Wu R

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2021.114271

Publication URI: http://dx.doi.org/10.1016/j.microrel.2021.114271

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability