Benchmarking the robustness of Si and SiC MOSFETs: Unclamped inductive switching and short-circuit performance (2022)

First Author: Ortiz Gonzalez J
Attributed to:  Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2022.114719

Publication URI: http://dx.doi.org/10.1016/j.microrel.2022.114719

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability