Focussed ion beam and field emission gun-scanning electron microscopy for the investigation of voiding and interface phenomena in thin-film solar cells (2011)

First Author: Major J
Attributed to:  SUPERGEN Photovoltaic Materials for the 21st Century funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/pip.1164

Publication URI: http://dx.doi.org/10.1002/pip.1164

Type: Journal Article/Review

Parent Publication: Progress in Photovoltaics: Research and Applications

Issue: 7