An approach to high-throughput X-ray diffraction analysis of combinatorial polycrystalline thin film libraries (2009)

First Author: Roncallo S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1107/s0021889809003227

Publication URI: http://dx.doi.org/10.1107/s0021889809003227

Type: Journal Article/Review

Parent Publication: Journal of Applied Crystallography

Issue: 2