Fast Pixel Detectors: a paradigm shift in STEM imaging
Lead Research Organisation:
University of Oxford
Department Name: Materials
Abstract
Abstracts are not currently available in GtR for all funded research. This is normally because the abstract was not required at the time of proposal submission, but may be because it included sensitive information such as personal details.
Publications
Liberti E
(2017)
Phase Retrieval Quantitative Comparison Between Tilt-series Imaging in TEM and Position-resolved Coherent Diffractive Imaging in STEM
in Microscopy and Microanalysis
Liberti E
(2019)
Three-dimensional Electron Ptychography of Catalyst Nanoparticles using Combined HAADF STEM and Atom Counting
in Microscopy and Microanalysis
Liberti E
(2016)
Quantitative Comparison of Phase Contrast Imaging in Conventional TEM Focal Series and STEM Ptychography
in Microscopy and Microanalysis
Liberti E
(2021)
Quantitative electron ptychography for simultaneous light and heavy elements atom counting
in Acta Crystallographica Section A Foundations and Advances
Lozano J
(2017)
Using Advanced STEM Techniques to Unravel Key Issues in the Development of Next-Generation Nanostructures for Energy Storage
in Microscopy and Microanalysis
Lozano JG
(2018)
Low-Dose Aberration-Free Imaging of Li-Rich Cathode Materials at Various States of Charge Using Electron Ptychography.
in Nano letters
Martinez G
(2017)
Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope
in Microscopy and Microanalysis
Martinez G
(2017)
A Comparison of Phase-retrieval Algorithms for Focused-probe Electron Ptychography
in Microscopy and Microanalysis
Martinez G
(2017)
Analysis of Phase Difference Variations for Strong Dynamical Objects Using Wigner Distribution Deconvolution Ptychography
in Microscopy and Microanalysis
Mostaed A
(2022)
A New Approach for 3D Quantitative STEM Using Defocus Corrected Electron Ptychography
in Microscopy and Microanalysis
Description | We have developed a method to measure the phase shift as an electron wave passes through a thin sample used in a transmission electron microscope. The method makes use of a phase retrieval approach called electron ptychography, which we have implemented in high-resolution scanning transmission electron microscopy. The method allows light elements to be imaged in radiation-sensitive materials. It also allows for correction of residual aberrations and the retrieval of 3D information. |
Exploitation Route | The software developed during the project is available at the link above. |
Sectors | Energy Healthcare Manufacturing including Industrial Biotechology Pharmaceuticals and Medical Biotechnology |
URL | https://gitlab.com/ptychoSTEM/ptychoSTEM |
Description | The use of 4 dimensional scanning transmission electron microscopy (4D STEM) has now become widespread, with the outcomes of this project providing some of the seminal methods and exemplar applications. The papers from the project have been cumulatively cited several many hundreds of times. The software methods have also been widely used, either from our own open source resource, or through incorporation into other open source libraries. The increased interest in 4D STEM has led to instrumental advances, with several manufacturers developing the necessary detectors. The techniques developed are now being used in applications including catalysis, photovoltaics, battery materials and polymer degradation. Please also see the impact description provided for EP/M009963/1 |
Sector | Energy,Environment |
Impact Types | Economic |
Description | Glasgow Fast Pixelated Detectors |
Organisation | University of Glasgow |
Department | Physics and Astronomy Department |
Country | United Kingdom |
Sector | Academic/University |
PI Contribution | We have made available software and methods for ptychographical reconstruction using STEM pixelated detector data. |
Collaborator Contribution | Access to the Medipix detector for data acquisition. |
Impact | Conference abstracts and presentations so far in this grant. |
Start Year | 2015 |
Description | JEOL / PN Detector |
Organisation | Jeol UK Ltd |
Country | United Kingdom |
Sector | Private |
PI Contribution | Demonstration of applications of prototype fast pixelated STEM detector. |
Collaborator Contribution | Loan of prototype fast pixelated detector. |
Impact | See publications linked to this award with JEOL co-authors. |
Start Year | 2015 |
Title | PtychoSTEM |
Description | Ptychography reconstruction software for 4D STEM data sets |
Type Of Technology | Software |
Year Produced | 2016 |
Open Source License? | Yes |
Impact | Widely used in the community. |