High Reliability Interconnects: New Methodologies for Lead-free Solders

Lead Research Organisation: Imperial College London
Department Name: Materials

Abstract

The reliability of electronics depends to a large degree on the reliability of the solder joints that interconnect the circuitry. Most solder joints contain tin as the majority phase to enable soldering at a temperature tolerable to the electronic components, but the tin must then operate at up to ~80% of its melting point due to resistance heating in service. As a percentage of melting point, this is as demanding as a turbine blade in an aeroengine and there is a similar ongoing desire to increase the operation temperature.

In service, the joints regularly cycle between ~50 and 80% of melting point due to cycles of resistance heating and natural cooling, which causes thermal expansion and contraction of all phases and, therefore, thermal fatigue due to the mismatch in the coefficient of thermal expansion (CTE) at interfaces. Joints can also experience shock impacts, vibration and surges in current density, all of which must be withstood to ensure successful operation.

Solder joints contain only up to a few tin grains and are highly heterogeneous with anisotropic properties. Therefore, to understand and predict the performance of solder joints it is necessary (i) to link mechanical measurements to the microstructure and crystallographic orientations in the joint and (ii) to develop crystal-level deformation and damage models that explicitly account for the evolving microstructure and link through to component and PCB-level models of thermal cycling, shock impact etc. Furthermore, to capitalise on the understanding generated by such an approach, it is necessary to develop the capability to reproducibly create the microstructures and orientations during the soldering process that are predicted to give optimum performance in service.

To deliver this vision, we bring together expertise in controlling solidification kinetics in solder alloys, in-situ micromechanical measurement of crystal slip and slip transfer across interfaces, defect nucleation and growth, and micromechanical modelling at the crystal and microstructure level and at the component and board-level. With this team, we seek a step change improvement in the understanding, prediction and manufacturing of solder joints that are optimised for high reliability in high value UK industry and in the consumer electronics industry.

The work addresses using solidification processing to generate single crystal and structurally representative units (e.g. intermetallic crystals (IMCs) with the desired facets, beta-Sn micro-pillars, or BGA joints with a single known beta-Sn orientation etc.). These are to be studied in carefully instrumented micromechanical tests to extract key material properties, and mechanistic understanding of defect nucleation at the crystal level. The properties and defect nucleation mechanisms are to be implemented in crystal plasticity models and, where necessary, discrete dislocation plasticity models to provide validated quantitative prediction of solder performance under thermo-mechanical and impact loading. The models are then to be exploited to design solder microstructures for optimal performance. The work will then develop methods to manufacture these optimum microstructures within the soldering process, building on recent advances in microstructure control made by the team. These optimised joints will then be tested and modelled such that optimally designed, high reliability joints may ultimately be achieved.

Planned Impact

The proposed methodology integrating processing-microstructure-properties-performance has the potential to provide optimal microstructures for solder joint performance tailored to the specific demands of the application. Performance and reliability of interconnects is crucial in safety-critical applications but equally in the mass consumer product markets where small efficiency gains are vital. For example, improved joint reliability can enable an increase in operation temperature capability which can contribute to automotive/aerospace lightweighting by allowing shielding to be removed and electronics to be located closer to sensors with shorter wires, both of which save mass. In safety-critical applications, the critical loading differs significantly from potential impact and accident mitigation in the nuclear energy sector through to elevated temperature high cycle fatigue superimposed on low-cycle thermal cycling in the aero-engine industry. One of the key challenges for the growing UK small modular reactor (SMR) programme led by Rolls-Royce is interestingly in instrumentation and control (as opposed to nuclear core development) for which the impact strength, endurance and reliability of solder interconnects is crucial. In the aero-engine industry, an aspiration is the full electrification of the plant, leading to massive pollutant reduction. In this safety-critical application, miniaturisation and light-weighting is key along with (mechanical) high and (thermal) low cycle fatigue endurance. In consumer mobile and computing needs, light-weighting and cost reduction are differentiators but the loading regimes for interconnects are different again to the previous two examples. Hence the ability to design and manufacture bespoke but optimally microstructured solders and to provide the generic methodology and tools with which to do so are potentially transformational. We believe our unique multi-disciplinary team and technique approach is world leading and has the potential to impact across the globe.

Publications

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Description The coarsening of strengthening particles such as Ag3Sn was studied using time-lapse imaging and bulk measurements to both understand the mechanisms and provide a mechanistic model of particle coarsening for the modelling stream.

Microstructure and damage evolution during thermal cycling was studied by in-situ electron backscatter diffraction (EBSD). This has revealed the formation of subgrains with continuous increase in misorientation during deformation, and the accumulation of plastic slip in strain-localised regions. This part of the project revealed and quantified the failure mechanisms in thermal cycling and will feed into the modelling stream of the project.

Micro-pillar compression studies of single crystals of pure tin have been combined with crystal plasticity finite element (CP-FE) modelling to identify the active slip systems in tetragonal tin and to extract their critical resolved shear stresses.

Creep studies combining electron backscatter diffraction (EBSD) and crystal plasticity finite element (CP-FE) modelling have extracted new understanding on the role of microstructural lengthscale on the creep response in Sn-Ag-Cu solders.

New understanding and predictive capability of reliability of ball grid array joints in thermal cycling has been gained by combining three approaches: (i) an Anand-based component-scale finite element model of the thermal cycling response of a thin-chip ball grid array (84CTBGA) has been developed. (ii) This has fed into a crystal plasticity finite element (CP-FE) model, and volume averaged model, of individual joints that accounts for the anisotropic elastic and thermal expansion behaviour, and time- and temperature-dependent plastic behaviour. (iii) These have then been combined with characterisation of joints in 84CTBGA packages after soldering and after thermal cycling. These studies have demonstrated and explained the dominant role of the orientation of tin as well as the role of the tin microstructure and intermetallic lengthscale.

We have studied the role of microstructure on the development of thermal fatigue damage by (i) experimental characterisation of damage accumulation in all joints within a BGA package that had undergone thermal cycling, coupled with (ii) the multi-scale CPFE model described in the previous paragraph. This has demonstrated and explained the best and worst microstructures for thermal fatigue. The results were somewhat surprising. For example, multigrain beachball joints were found to perform worse than single grain joints. This has been explained in terms of the development of localised plasticity near grain boundaries in beachballs. this study has shown the need to control both cyclic twinning and the orientation of tin grains to optimise performance.
Exploitation Route The findings from this funding have (i) identified the optimum microstructures for solder joint reliability and methods to generate these microstructures, and (ii) provide a modelling framework that can be used to predict aspects of solder joint reliability. We have separately developed a method to control the orientation of solder joints. Next, industrial partners can attempt to implement these ideas to generate solder joints with improved performance.
Sectors Aerospace, Defence and Marine,Digital/Communication/Information Technologies (including Software),Electronics,Manufacturing, including Industrial Biotechology,Transport

 
Description A broad impact from this research has been an improved understanding of the mechanisms underpinning lead-free solders. This is particularly important for high reliability applications which are currently exempt from Pb-free legislation but which soon need to transition. This includes the defence and security sectors that are important to a robust and resilient nation as well as space and avionics which are important manufacturing sectors in our country. A further impact has been the development of a collaboration with the group of Richard Coyle at Nokia Bell Labs in the USA. This gave the project greater industrial relevance, improved the science and promoted UK-USA collaboration. From this collaboration, we also interacted with US bodies such as the Pb-Free Electronics Risk Management (PERM) Council of the US Institute of Printed Circuits (IPC) who represent US companies and government bodies looking to transition to Pb-free electronics.
Sector Aerospace, Defence and Marine,Electronics,Manufacturing, including Industrial Biotechology,Security and Diplomacy
Impact Types Economic

 
Description Richard Coyle, Nokia Bell Labs 
Organisation Nokia
Department Nokia Bell Labs
Country United States 
Sector Private 
PI Contribution Our research team characterised and modelled the electronic package provided by Richard Coyle.
Collaborator Contribution Richard Coyle provided electronic packages after soldering and after thermal cycling, and was an active member of discussions on microsturcture and damage evolution.
Impact Belyakov SA, Coyle RJ, Arfaei B, Xian JW, Gourlay CM. Microstructure and Damage Evolution During Thermal Cycling of Sn-Ag-Cu Solders Containing Antimony. J Electron Mater. 2021;50(3):825-41.
Start Year 2019